NO CALIBRATION:

Our patented technology permits measurements of force without the repetitive and time-consuming, error-prone calibrations of other systems.

ADDITIONAL

EXPERIMENTAL

QUANTITIES:

Laser power at the sample and ambient temperature are also provided by the system, for convenience in the analysis of experimental results. Viscosity of the medium and size of sample can be easily obtained as well.

EASY INSTALLATION

AND OPERATION:

The Lunam™ replaces the microscope condenser and can be installed and set in operation through a simple 

•      Dual measurement mode: force measurements and trap stiffness calibration for position tracking.

•      Symmetric opto-mechanical design, compatible with Nikon microscopes (TE2000 and Ti) (T-DH and TI-DH illumination columns)and Zeiss.

•      Straightforward installation and tuning routines ensure correct measurements and reproducibility (eyepiece with Bertrand lens incorporated or Centering Scope required).

•      High Numerical-Aperture (NA=1.4) immersion optics. Optical design optimized for λ=1064 nm and λ=980 nm.

•      Maximum laser power at the sample: 300 mW (Check with us different power ranges to fit your needs)

•      Force resolution 10 fN

•      Position resolution < 1 nm (typ.)

•      Integrated sensor noise over the whole bandwidth < 0.1 pN (typ.)

•      Temperature-compensated, duo-lateral position sensitive detector (PSD) (50 kHz).

•      Up to 100 kHz, 18-bit, analog-to-digital conversion.